JPH0134113Y2 - - Google Patents
Info
- Publication number
- JPH0134113Y2 JPH0134113Y2 JP1980090085U JP9008580U JPH0134113Y2 JP H0134113 Y2 JPH0134113 Y2 JP H0134113Y2 JP 1980090085 U JP1980090085 U JP 1980090085U JP 9008580 U JP9008580 U JP 9008580U JP H0134113 Y2 JPH0134113 Y2 JP H0134113Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- ray
- slit
- electron beam
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1980090085U JPH0134113Y2 (en]) | 1980-06-27 | 1980-06-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1980090085U JPH0134113Y2 (en]) | 1980-06-27 | 1980-06-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5717438U JPS5717438U (en]) | 1982-01-29 |
JPH0134113Y2 true JPH0134113Y2 (en]) | 1989-10-17 |
Family
ID=29452098
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1980090085U Expired JPH0134113Y2 (en]) | 1980-06-27 | 1980-06-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0134113Y2 (en]) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5134316U (en]) * | 1974-09-04 | 1976-03-13 | ||
NL7806330A (nl) * | 1978-06-12 | 1979-12-14 | Philips Nv | Roentgenspektrometer. |
-
1980
- 1980-06-27 JP JP1980090085U patent/JPH0134113Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5717438U (en]) | 1982-01-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100669846B1 (ko) | 표면 상의 이상을 검사하기 위한 스캐닝 방법 및 시스템 | |
CA1229897A (en) | Optics system for emission spectrometer | |
JP5127976B2 (ja) | 可変コリメータを有する放射分析用装置 | |
US6198095B1 (en) | Apparatus and method for imaging a particle beam | |
GB2216331A (en) | Instrument for mass spectrometry/mass spectrometry | |
JPH0134113Y2 (en]) | ||
JP2002189004A (ja) | X線分析装置 | |
JP2002131251A (ja) | X線分析装置 | |
US4331872A (en) | Method for measurement of distribution of inclusions in a slab by electron beam irradiation | |
JPH0136061B2 (en]) | ||
JP2968460B2 (ja) | X線分析方法 | |
US4942298A (en) | Electron spectrometer | |
US12031924B2 (en) | Measurement arrangement for X-ray radiation for gap-free 1D measurement | |
JPS598282Y2 (ja) | 電子ビ−ムマクロアナライザ | |
JPH0124619Y2 (en]) | ||
JPS61158658A (ja) | 複合表面評価装置 | |
JPH08152378A (ja) | 光ファイバーの検査方法および装置 | |
JP2917475B2 (ja) | X線分析装置 | |
JP2961384B2 (ja) | 螢光x線による膜厚測定方法 | |
JPS5814038A (ja) | 電子ビ−ムマクロアナライザを用いた鋼板分析装置 | |
JPH0676780A (ja) | X線マイクロアナライザ | |
JP2001188098A (ja) | X線ビーム調整装置及びx線装置 | |
JPS58178948A (ja) | 電子線照射型分析装置の試料装置 | |
JPH0426044A (ja) | X線分析装置 | |
KR20060092549A (ko) | 고해상 엑스선회절 장비에서의 지그를 이용한 엑스선 빔 정렬 방법 |